Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization.

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An MBE growth facility for real-time in situ synchrotron x-ray topography studies of strained-layer III-V epitaxial materials.Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers.

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Vinylogous Tetrathiafulvalene (ttf) Pi-electron Donors And Derived Radical Cations: Esr Spectroscopic, Magnetic, And X-ray Structural Studies. Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers.Käytämme evästeitä personoidaksemme sivustomme sisältöä ja mainoksia, tarjotaksemme sosiaalisen median toimintoja ja analysoidaksemme liikennettä. Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale.